Development of a testing methodology to predict optical disk life expectancy values
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Main Author: | Podio, Fernando L. |
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Other Authors: | National Institute of Standards and Technology (U.S.) |
Format: | Microfilm |
Language: | English |
Published: |
Gaithersburg, MD : [Springfield, VA] :
U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology ; [Order from National Technical Information Service],
1991.
|
Physical Description: |
xv, 84 pages : illustrations ; 28 cm. |
Series: |
NIST special publication ;
500-200. NIST special publication. Computer systems technology. |
Subjects: |
In Prospector
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