Development of a testing methodology to predict optical disk life expectancy values
| Main Author: | Podio, Fernando L. |
|---|---|
| Other Authors: | National Institute of Standards and Technology (U.S.) |
| Format: | Microfilm |
| Language: | English |
| Published: |
Gaithersburg, MD : [Springfield, VA] :
U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology ; [Order from National Technical Information Service],
1991.
|
| Physical Description: |
xv, 84 pages : illustrations ; 28 cm. |
| Series: |
NIST special publication ;
500-200. NIST special publication. Computer systems technology. |
| Subjects: |
CMU Storage Gov Pub Microfiche
| Location | Call Number: | Status |
|---|---|---|
| CMU Storage Gov Pub Microfiche | C 13.10:500-200 | Available |