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Podio, Fernando L.
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1
Development of a testing methodology to predict optical disk life expectancy values
by
Podio
,
Fernando
L
.
Published: U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology ; [Order from National Technical Information Service], 1991
Description: xv, 84 pages : illustrations ; 28 cm.
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2
Conformance test architecture for biometric data interchange formats version beta 2.0
by
Podio
,
Fernando
L
.
Published: U.S. Dept. of Commerce, National Institute of Standards and Technology, 2011
Description: 1 online resource (30 pages) : color illustrations.
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3
Conformance test architecture and test suite for ANSI/NIST-ITL 1-2007
by
Podio
,
Fernando
L
.
Published: U.S. Dept. of Commerce, National Institute of Standards and Technology, 2011
Description: 1 online resource (vi, 70 pages) : illustrations (chiefly color).
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4
Common Biometric Exchange Formats Framework (CBEFF)
Published: U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, 2004
Description: x, 29 pages : digital, PDF file.
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5
Test methods for optical disk media characteristics for 356 mm ruggedized magneto-optic media
Published: U.S. Dept. of Commerce, National Institute of Standards and Technology ; [Order from National Technical Information Service], 1991
Description: xv, 64 pages : illustrations ; 28 cm.
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6
Emerging network storage management standards for intelligent data storage subsystems
Published: U.S. Department of Commerce, Technology Administration, National Institute of Standards and Technology, 1998
Description: vii, 12 pages.
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7
ANSI/NIST-ITL 1-2011 requirements and conformance test assertions
by
McGinnis, Christofer J.
Published: U.S. Dept. of Commerce, National Institute of Standards and Technology, 2011
Description: 1 online resource (vi, 180 pages).
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8
Monitoring and reporting techniques for error rate and error distribution in optical disk systems proceedings of a workshop held in Colorado Springs, Colorado on August 5, 1991
Published: U.S. Dept. of Commerce, National Institute of Standards and Technology ; [Order from National Technical Information Service], 1991
Description: vii, 83 pages : illustrations ; 28 cm.
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9
Monitoring and reporting techniques for error rate and error distribution in optical disk systems : proceedings of a workshop held in Colorado Springs, Colorado on August 5, 1991
Published: U.S. Dept. of Commerce, National Institute of Standards and Technology, 1991
Description: vii, 83 pages : illustrations ; 28 cm.
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Related Subjects
Biometric identification Computer programs Standards
Biometric identification Data processing
Internetworking (Telecommunication) Standards
Optical storage devices
Optical disks
Optical disks Testing
Biometry Data processing
Computer networks Standards
Electronic data interchange Standards
Information storage and retrieval systems
Information technology Standards
Optical disks Standards
Service life (Engineering)
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