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Development of a testing methodology to predict optical disk life expectancy values
Saved in:
| Main Author: | |
|---|---|
| Corporate Author: | |
| Format: | Microfilm Book |
| Language: | English |
| Published: |
Gaithersburg, MD : [Springfield, VA] :
U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology ; [Order from National Technical Information Service],
1991.
|
| Series: | NIST special publication ;
500-200. NIST special publication. Computer systems technology. |
| Physical Description: |
xv, 84 pages : illustrations ; 28 cm. |
| Subjects: |
MARC
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|---|---|---|---|
| 001 | ocm26981476 | ||
| 003 | OCoLC | ||
| 005 | 19940123094639.0 | ||
| 007 | he-bmb024bbca | ||
| 008 | 921116s1991 mdua bbt f000 0 eng d | ||
| 037 | |a 003-003-03134-8 |b GPO |f paper copy | ||
| 040 | |a GAO |b eng |c GAO |d GPO | ||
| 049 | |a COM4 | ||
| 074 | |a 0247 (MF) | ||
| 090 | |a QC100 |b .U57 no.500-200 | ||
| 090 | |a C 13.10:500-200 | ||
| 100 | 1 | |a Podio, Fernando L. |0 https://id.loc.gov/authorities/names/n92081962. | |
| 245 | 1 | 0 | |a Development of a testing methodology to predict optical disk life expectancy values |h [microform] / |c Fernando L. Podio. |
| 264 | 1 | |a Gaithersburg, MD : |b U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology ; |a [Springfield, VA] : |b [Order from National Technical Information Service], |c 1991. | |
| 300 | |a xv, 84 pages : |b illustrations ; |c 28 cm. | ||
| 336 | |a text |b txt |2 rdacontent. | ||
| 337 | |a microform |b h |2 rdamedia. | ||
| 338 | |a microfiche |b he |2 rdacarrier. | ||
| 490 | 1 | |a NIST special publication ; |v 500-200. |a Computer systems technology. | |
| 500 | |a Distributed to depository libraries in microfiche. | ||
| 500 | |a Shipping list no.: 92-2116-M. | ||
| 500 | |a Paper version no longer for sale by the Supt. of Docs. | ||
| 500 | |a "December 1991." | ||
| 504 | |a Includes bibliographical references (pages 83-84). | ||
| 513 | |a Final. | ||
| 533 | |a Microfiche. |b [Washington, D.C.?] : |c Supt. of Docs., U.S. G.P.O., |d [1992] |e 2 microfiches : negative. | ||
| 536 | |a Sponsored by U.S. National Archives and Records Administration. | ||
| 650 | 0 | |a Optical disks |0 https://id.loc.gov/authorities/subjects/sh86004405 |x Testing. |0 https://id.loc.gov/authorities/subjects/sh99005648. | |
| 650 | 0 | |a Service life (Engineering) |0 https://id.loc.gov/authorities/subjects/sh85120354. | |
| 655 | 7 | |a Technical reports. |2 lcgft |0 https://id.loc.gov/authorities/genreForms/gf2015026093. | |
| 710 | 2 | |a National Institute of Standards and Technology (U.S.) |0 https://id.loc.gov/authorities/names/n88112126. | |
| 830 | 0 | |a NIST special publication ; |0 https://id.loc.gov/authorities/names/n88507958 |v 500-200. | |
| 830 | 0 | |a NIST special publication. |p Computer systems technology. |0 https://id.loc.gov/authorities/names/no91004789. | |
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| 948 | |a MARCIVE Comp, 2018.05 | ||
| 948 | |a MARCIVE August, 2017 | ||
| 948 | |a MARCIVE extract Aug 5, 2017 | ||
| 995 | |a Loaded with m2btab.ltiac in 2022.12 | ||
| 995 | |a Loaded with m2btab.ltiac in 2018.06 | ||
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