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Development of a testing methodology to predict optical disk life expectancy values
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Main Author: | |
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Corporate Author: | |
Format: | Microfilm Book |
Language: | English |
Published: |
Gaithersburg, MD : [Springfield, VA] :
U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology ; [Order from National Technical Information Service],
1991.
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Series: | NIST special publication ;
500-200. NIST special publication. Computer systems technology. |
Physical Description: |
xv, 84 pages : illustrations ; 28 cm. |
Subjects: |
Item Description: | Distributed to depository libraries in microfiche. Shipping list no.: 92-2116-M. Paper version no longer for sale by the Supt. of Docs. "December 1991." |
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Type of Report and Period Covered: |
Final. |
Reproduction: |
Microfiche. [Washington, D.C.?] : Supt. of Docs., U.S. G.P.O., [1992] 2 microfiches : negative. |
Funding Information: |
Sponsored by U.S. National Archives and Records Administration. |
Physical Description: |
xv, 84 pages : illustrations ; 28 cm. |
Bibliography: | Includes bibliographical references (pages 83-84). |