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Development of a testing methodology to predict optical disk life expectancy values

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Bibliographic Details
Main Author:	Podio, Fernando L.
Corporate Author:	National Institute of Standards and Technology (U.S.)
Format:	Microfilm Book
Language:	English
Published:	Gaithersburg, MD : [Springfield, VA] : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology ; [Order from National Technical Information Service], 1991.
Series:	NIST special publication ; 500-200. NIST special publication. Computer systems technology.
Physical Description:	xv, 84 pages : illustrations ; 28 cm.
Subjects:	Optical disks -- Testing. Service life (Engineering)

Description
Item Description:	Distributed to depository libraries in microfiche. Shipping list no.: 92-2116-M. Paper version no longer for sale by the Supt. of Docs. "December 1991."
Type of Report and Period Covered:	Final.
Reproduction:	Microfiche. [Washington, D.C.?] : Supt. of Docs., U.S. G.P.O., [1992] 2 microfiches : negative.
Funding Information:	Sponsored by U.S. National Archives and Records Administration.
Physical Description:	xv, 84 pages : illustrations ; 28 cm.
Bibliography:	Includes bibliographical references (pages 83-84).