Antireflecting-chromium linewidth standard, SRM 473, for calibration of optical microscope linewidth measuring systems standard reference materials /
| Main Author: | Vezzetti, Carol F. |
|---|---|
| Other Authors: | Varner, Ruth N., Potzick, James E., National Institute of Standards and Technology (U.S.) |
| Format: | Book |
| Language: | English |
| Published: |
Gaithersburg, MD : [Springfield, VA :] :
U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology ; [Order from National Technical Information Service],
[1992]
|
| Physical Description: |
1 volume. |
| Series: |
NIST special publication ;
260-119. |
| Subjects: |
CMU Storage Gov Pub Microfiche
| Location | Call Number: | Status |
|---|---|---|
| CMU Storage Gov Pub Microfiche | C 13.10:260-119 | Available |