Antireflecting-chromium linewidth standard, SRM 473, for calibration of optical microscope linewidth measuring systems

by Potzick, James E.
Published: U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology ; For sale by the Supt. of Docs., U.S. G.P.O., 1997

Antireflecting-chromium linewidth standard, SRM 475, for calibration of optical microscope linewidth measuring systems

by Vezzetti, Carol F.
Published: U.S. Dept. of Commerce, National Institute of Standards and Technology ; [Order from National Technical Information Service], 1992

Bright-chromium linewidth standard, SRM 476, for calibration of optical microscope linewidth measuring systems

by Vezzetti, Carol F.
Published: U.S. Dept. of Commerce, National Institute of Standards and Technology, 1991

Antireflecting-chromium linewidth standard, SRM 473, for calibration of optical microscope linewidth measuring systems standard reference materials

by Vezzetti, Carol F.
Published: U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology ; [Order from National Technical Information Service], 1992