Randomness testing of the advanced encryption standard finalist candidates

Main Author: Soto, Juan, 1969-
Other Authors: Bassham, Lawrence E., National Institute of Standards and Technology (U.S.)
Format: Microfilm
Language: English
Published: Gaithersburg, MD : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, [2000]
Physical Description: 14 pages : illustrations ; 28 cm.
Also available via Internet from the NIST web site. Address as of 9/5/06: http://csrc.nist.gov/publications/nistir/ir6483.pdf ; current access is available via PURL.
Series: NISTIR ; 6483.
Subjects:
Online Access: https://purl.fdlp.gov/GPO/LPS73693
https://purl.fdlp.gov/GPO/LPS73693

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