A statistical test suite for random and pseudorandom number generators for cryptographic applications
Other Authors: | Rukhin, Andrew L., National Institute of Standards and Technology (U.S.) |
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Format: | Microfilm |
Language: | English |
Published: |
Gaithersburg, MD : Washington, D.C. :
U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology ; For sale by the Supt. of Docs., U.S. G.P.O.,
[2000]
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Physical Description: |
x, 152 pages : illustrations ; 28 cm. |
Series: |
NIST special publication ;
800-22. NIST special publication. Computer security. |
Subjects: |
CMU Storage Gov Pub Microfiche
Location | Call Number: | Status |
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CMU Storage Gov Pub Microfiche | C 13.10:800-22 | Available |