A statistical test suite for random and pseudorandom number generators for cryptographic applications

Other Authors: Rukhin, Andrew L., National Institute of Standards and Technology (U.S.)
Format: Microfilm
Language: English
Published: Gaithersburg, MD : Washington, D.C. : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology ; For sale by the Supt. of Docs., U.S. G.P.O., [2000]
Physical Description: x, 152 pages : illustrations ; 28 cm.
Series: NIST special publication ; 800-22.
NIST special publication. Computer security.
Subjects:

CMU Storage Gov Pub Microfiche

LocationCall Number: Status
CMU Storage Gov Pub Microfiche C 13.10:800-22 Available