Cryptographic module testing

Main Author: Horlick, Jeffrey.
Other Authors: Lee, Annabelle., Carnahan, Lisa J., National Institute of Standards and Technology (U.S.), NVLAP (Program : U.S.)
Format: Microfilm
Language: English
Published: Gaithersburg, Md. : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, [2000]
Physical Description: 1 volume (various pagings) : illustrations ; 28 cm.
Also available online.
Series: NIST handbook ; 150-17.
Subjects:
Online Access: http://purl.access.gpo.gov/GPO/LPS15917
http://purl.access.gpo.gov/GPO/LPS15917

CMU Storage Gov Pub Microfiche

LocationCall Number: Status
CMU Storage Gov Pub Microfiche C 13.11:150-17 Available