Cryptographic module testing

Main Author: Horlick, Jeffrey.
Other Authors: Lee, Annabelle., Carnahan, Lisa J., National Institute of Standards and Technology (U.S.), NVLAP (Program : U.S.)
Format: eBook
Language: English
Published: Gaithersburg, Md. : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, [2000]
Physical Description: 1 online resource.
Series: NIST handbook ; 150-17.
Subjects:
Online Access: http://purl.access.gpo.gov/GPO/LPS15917
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