Improved characterization and evaluation measurements for HgCdTe detector materials, processes, and devices used on the GOES and TIROS satellites

Other Authors: Seiler, David G., National Institute of Standards and Technology (U.S.)
Format: Microfilm
Language: English
Published: Gaithersburg, MD : Washington, DC : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology ; For sale by the Supt. of Docs., U.S. G.P.O., 1994.
Physical Description: 1 volume (various pagings) : illustrations.
Series: Semiconductor measurement technology.
NIST special publication ; 400-94.
Subjects:
LEADER 02300cam a2200529Ia 4500
001 31351017
003 OCoLC
005 19941127100845.0
007 he-bmb024bbca
008 941025s1994 mdua bb f000 0 eng d
037 |a 003-003-03263-8  |b GPO  |f paper copy  |c $12.00 
040 |a BGU  |b eng  |c BGU  |d GPO 
043 |a n-us--- 
049 |a COM4 
074 |a 0247 (MF) 
245 0 0 |a Improved characterization and evaluation measurements for HgCdTe detector materials, processes, and devices used on the GOES and TIROS satellites  |h [microform] /  |c David G. Seiler ... [and others]. 
264 1 |a Gaithersburg, MD :  |b U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology ;  |a Washington, DC :  |b For sale by the Supt. of Docs., U.S. G.P.O.,  |c 1994. 
300 |a 1 volume (various pagings) :  |b illustrations. 
336 |a text  |b txt  |2 rdacontent. 
337 |a microform  |b h  |2 rdamedia. 
338 |a microfiche  |b he  |2 rdacarrier. 
490 1 |a Semiconductor measurement technology. 
490 1 |a NIST special publication ;  |v 400-94. 
500 |a Distributed to depository libraries in microfiche. 
500 |a Shipping list no.: 94-0562-M. 
500 |a "April 1994." 
504 |a Includes bibliographical references. 
533 |a Microfiche.  |b [Washington, D.C.?] :  |c Supt. of Docs., U.S. G.P.O.,  |d [1994]  |e 3 microfiches : negative. 
539 |a s  |b 1994  |d dcu  |e n  |g b. 
650 0 |a Infrared detectors  |z United States. 
650 0 |a Meteorological satellites  |z United States. 
650 0 |a Geostationary satellites. 
650 0 |a TIROS satellites. 
700 1 |a Seiler, David G. 
710 2 |a National Institute of Standards and Technology (U.S.) 
830 0 |a Semiconductor measurement technology. 
830 0 |a NIST special publication ;  |v 400-94. 
907 |a .b14013915  |b cug   |c -  |d 010628  |e 230519 
998 |a cug  |b 020202  |c m  |d a   |e -  |f eng  |g mdu  |h 0  |i 0 
902 |a 060711 
902 |a 010713 
948 |a MARCIVE Comp, in 2022.12 
948 |a MARCIVE August, 2017 
948 |a MARCIVE extract Aug 5, 2017 
995 |a Loaded with m2btab.ltiac in 2022.12 
995 |a Loaded with m2btab.ltiac in 2017.08 
989 |a C 13.10:400-94  |d cusgh  |e  - -   |f  - -   |g -   |h 0  |i 0  |j 67  |k 020202  |l $0.00  |m    |n  - -   |o -  |p 0  |q 0  |t 0  |x 0  |1 .i3079917x