Improved characterization and evaluation measurements for HgCdTe detector materials, processes, and devices used on the GOES and TIROS satellites
| Other Authors: | Seiler, David G., National Institute of Standards and Technology (U.S.) |
|---|---|
| Format: | Microfilm |
| Language: | English |
| Published: |
Gaithersburg, MD : Washington, DC :
U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology ; For sale by the Supt. of Docs., U.S. G.P.O.,
1994.
|
| Physical Description: |
1 volume (various pagings) : illustrations. |
| Series: |
Semiconductor measurement technology.
NIST special publication ; 400-94. |
| Subjects: |
CMU Storage Gov Pub Microfiche
| Location | Call Number: | Status |
|---|---|---|
| CMU Storage Gov Pub Microfiche | C 13.10:400-94 | Available |