Improved characterization and evaluation measurements for HgCdTe detector materials, processes, and devices used on the GOES and TIROS satellites

Published: U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology ; For sale by the Supt. of Docs., U.S. G.P.O., 1994

Survey of optical characterization methods for materials, processing, and manufacturing in the semiconductor industry

by Bullis, W. Murray, 1930-
Published: U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, 1995