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  1. 1

    Survey of optical characterization methods for materials, processing, and manufacturing in the semiconductor industry by Bullis, W. Murray, 1930-

    Published: U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, 1995
    Description: iv, 51 pages : illustrations ; 28 cm.
    Microfilm Book
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    Survey of optical characterization methods for materials, processing, and manufacturing in the semiconductor industry
  2. 2

    Characterization of semiconductor heterostructures and nanostructures Second edition / by ScienceDirect (Online service)

    Published: Elsevier Science, 2013
    Description: 1 online resource (xiii, 813 pages)
    Elsevier - Click here for access
    eBook
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    Characterization of semiconductor heterostructures and nanostructures

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