Search Results
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1
Survey of optical characterization methods for materials, processing, and manufacturing in the semiconductor industry
Published: U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, 1995Description: iv, 51 pages : illustrations ; 28 cm.Microfilm Book -
2
Characterization of semiconductor heterostructures and nanostructures Second edition /
Published: Elsevier Science, 2013Elsevier - Click here for accessDescription: 1 online resource (xiii, 813 pages)
eBook