Distributed testing of a device-level interface specification for a metrology system
| Other Authors: | Horst, John., National Institute of Standards and Technology (U.S.) |
|---|---|
| Format: | Microfilm |
| Language: | English |
| Published: |
Gaithersburg, MD :
U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology,
[2002]
|
| Physical Description: |
19 pages : illustrations ; 28 cm. |
| Series: |
NISTIR ;
6851. |
| Subjects: |
CMU Storage Gov Pub Microfiche
| Location | Call Number: | Status |
|---|---|---|
| CMU Storage Gov Pub Microfiche | C 13.58:6851 | Available |