A specification-based coverage metric to evaluate test sets

Main Author: Ammann, Paul, 1961-
Other Authors: Black, Paul E., National Institute of Standards and Technology (U.S.)
Format: Microfilm
Language: English
Published: Gaithersburg, MD : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, [1999]
Physical Description: 27 pages : illustrations.
Series: NISTIR ; 6403.
Subjects:

CMU Storage Gov Pub Microfiche

LocationCall Number: Status
CMU Storage Gov Pub Microfiche C 13.58:6403 Available