Model checkers in software testing

Main Author: Black, Paul E.
Other Authors: Ammann, Paul., Ding, Wei, 1967 September 14-, National Institute of Standards and Technology (U.S.)
Format: Microfilm
Language: English
Published: Gaithersburg, MD : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, [2002]
Physical Description: 40 pages : illustrations ; 28 cm.
Series: NISTIR ; 6777.
Subjects:

CMU Storage Gov Pub Microfiche

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CMU Storage Gov Pub Microfiche C 13.58:6777 Available