Calibration of X-ray and gamma-ray measuring instruments

Main Author: Lamperti, Paul J.
Other Authors: O'Brien, Michelle., National Institute of Standards and Technology (U.S.)
Format: Microfilm
Language: English
Published: Gaithersburg, Md. : Washington, DC : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology ; For sale by the Supt. of Docs., U.S. G.P.O., [2001]
Physical Description: ix, 87 pages : illustrations ; 28 cm.
Series: NIST special publication. NIST measurement services.
NIST special publication ; 250-58.
Subjects:
Item Description: "April 2001."
Shipping list no.: 2001-0478-M.
"Supersedes NIST special publication 250-16 (March 1988)."
Includes bibliographical references (pages 60-62)
Microfiche. [Washington, D.C.] : Supt. of Docs., U.S.G.P.O., 2001 2 microfiches : negative.
Physical Description: ix, 87 pages : illustrations ; 28 cm.
Bibliography: Includes bibliographical references (pages 60-62)