A computer-controlled tensile stage for in-situ X-ray measurements

Main Author: Levine, L. E.
Other Authors: Fields, R. J., National Institute of Standards and Technology (U.S.)
Format: Microfilm
Language: English
Published: Gaithersburg, MD : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, [1997]
Physical Description: 10 pages : illustrations.
Series: NISTIR ; 5867.
Subjects:

CMU Storage Gov Pub Microfiche

LocationCall Number: Status
CMU Storage Gov Pub Microfiche C 13.58:5867 Available