A computer-controlled tensile stage for in-situ X-ray measurements

Main Author: Levine, L. E.
Other Authors: Fields, R. J., National Institute of Standards and Technology (U.S.)
Format: Microfilm
Language: English
Published: Gaithersburg, MD : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, [1997]
Physical Description: 10 pages : illustrations.
Series: NISTIR ; 5867.
Subjects:
Item Description: Shipping list no.: 98-0569-M.
"December 1997."
Includes bibliographical references (page 7).
Microfiche. [Washington, D.C.] : Supt. of Docs., U.S. G.P.O., [1998] 1 microfiche : negative.
Physical Description: 10 pages : illustrations.
Bibliography: Includes bibliographical references (page 7).