Calibration of X-ray and gamma-ray measuring instruments

Main Author: Lamperti, Paul J.
Other Authors: O'Brien, Michelle., National Institute of Standards and Technology (U.S.)
Format: Microfilm
Language: English
Published: Gaithersburg, Md. : Washington, DC : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology ; For sale by the Supt. of Docs., U.S. G.P.O., [2001]
Physical Description: ix, 87 pages : illustrations ; 28 cm.
Series: NIST special publication. NIST measurement services.
NIST special publication ; 250-58.
Subjects:

CMU Storage Gov Pub Microfiche

LocationCall Number: Status
CMU Storage Gov Pub Microfiche C 13.10:250-58 Available