Symposium on X-Ray and Electron Probe Analysis papers presented at the sixty-sixth annual meeting, American Society for Testing and Materials, Atlantic City, N.J., June 27, 1963.
| Corporate Authors: | Symposium on X-Ray and Electron Probe Analysis Atlantic City) |
|---|---|
| Other Authors: | Symposium on X-Ray and Electron Probe Analysis, ASTM Committee E-2 on Emission Spectroscopy., American Society for Testing and Materials. Committee E-4 on Metallography. |
| Format: | Book |
| Language: | English |
| Published: |
Philadelphia :
American Society for Testing and Materials,
1964.
|
| Physical Description: |
vi, 209 pages : illustrations ; 24 cm. |
| Series: |
ASTM special technical publication ;
349. |
| Subjects: |