Symposium on X-Ray and Electron Probe Analysis papers presented at the sixty-sixth annual meeting, American Society for Testing and Materials, Atlantic City, N.J., June 27, 1963.

Corporate Authors: Symposium on X-Ray and Electron Probe Analysis Atlantic City)
Other Authors: Symposium on X-Ray and Electron Probe Analysis, ASTM Committee E-2 on Emission Spectroscopy., American Society for Testing and Materials. Committee E-4 on Metallography.
Format: Book
Language: English
Published: Philadelphia : American Society for Testing and Materials, 1964.
Physical Description: vi, 209 pages : illustrations ; 24 cm.
Series: ASTM special technical publication ; 349.
Subjects:
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655 7 |a Conference papers and proceedings.  |2 lcgft. 
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