Symposium on X-Ray and Electron Probe Analysis papers presented at the sixty-sixth annual meeting, American Society for Testing and Materials, Atlantic City, N.J., June 27, 1963.
Corporate Authors: | Symposium on X-Ray and Electron Probe Analysis Atlantic City) |
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Other Authors: | Symposium on X-Ray and Electron Probe Analysis, ASTM Committee E-2 on Emission Spectroscopy., American Society for Testing and Materials. Committee E-4 on Metallography. |
Format: | Book |
Language: | English |
Published: |
Philadelphia :
American Society for Testing and Materials,
1964.
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Physical Description: |
vi, 209 pages : illustrations ; 24 cm. |
Series: |
ASTM special technical publication ;
349. |
Subjects: |
CMU Main Books 3rd Floor
Location | Call Number: | Status |
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CMU Main Books 3rd Floor | QD95 .S95 1963 |
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