Built-in fault-tolerant computing paradigm for resilient large-scale chip design a self-test, self-diagnosis, and self-repair-based approach /
With the end of Dennard scaling and Moores law, IC chips, especially large-scale ones, now face more reliability challenges, and reliability has become one of the mainstay merits of VLSI designs. In this context, this book presents a built-in on-chip fault-tolerant computing paradigm that seeks to c...
Main Author: | Li, Xiaowei. |
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Other Authors: | Yan, Guihai., Liu, Cheng., SpringerLink (Online service) |
Format: | eBook |
Language: | English |
Published: |
Singapore :
Springer,
2023.
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Physical Description: |
1 online resource (318 pages) |
Subjects: |
CMU Electronic Access
Electronic Resource Click HereLocation | Call Number: | Status |
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CMU Electronic Access | Available |