Built-in fault-tolerant computing paradigm for resilient large-scale chip design a self-test, self-diagnosis, and self-repair-based approach /
With the end of Dennard scaling and Moores law, IC chips, especially large-scale ones, now face more reliability challenges, and reliability has become one of the mainstay merits of VLSI designs. In this context, this book presents a built-in on-chip fault-tolerant computing paradigm that seeks to c...
| Main Author: | Li, Xiaowei. |
|---|---|
| Other Authors: | Yan, Guihai., Liu, Cheng., SpringerLink (Online service) |
| Format: | eBook |
| Language: | English |
| Published: |
Singapore :
Springer,
2023.
|
| Physical Description: |
1 online resource (318 pages) |
| Subjects: |
CMU Electronic Access
Electronic Resource Click Here| Location | Call Number: | Status |
|---|---|---|
| CMU Electronic Access | Available |