Holdings: Metrology for radio frequency technology

Main Author:	National Institute of Standards and Technology (U.S.)
Format:	Microfilm
Language:	English
Published:	Boulder, CO : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology.
Physical Description:	volumes : illustrations ; 28 cm.
Series:	NISTIR.
Subjects:	National Institute of Standards and Technology (U.S.) -- Bibliography -- Periodicals. Radio frequency -- Bibliography -- Periodicals. Radio measurements -- Bibliography -- Periodicals.

Location	Call Number:	Status
CMU Storage Gov Pub Microfiche	C 13.58:	Available