Metrology for radio-frequency technology a bibliography of NIST publications /

Main Author: Lyons, Ruth Marie.
Other Authors: National Institute of Standards and Technology (U.S.)
Format: Microfilm
Language: English
Published: Boulder, Colo. : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, [1999]
Physical Description: iii, 145 pages.
Series: NISTIR ; 5084.
Subjects:

CMU Storage Gov Pub Microfiche

LocationCall Number: Status
CMU Storage Gov Pub Microfiche C 13.58:5084 Available