Metrology for information technology (IT)

Main Author: MEL/ITL Task Group on Metrology for Information Technology (IT)
Other Authors: National Institute of Standards and Technology (U.S.)
Format: Microfilm
Language: English
Published: Gaithersburg, MD : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, [1997]
Physical Description: 28 pages : illustrations ; 28 cm.
Series: NISTIR ; 6025.
Subjects:

CMU Storage Gov Pub Microfiche

LocationCall Number: Status
CMU Storage Gov Pub Microfiche C 13.58:6025 Available