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Vezzetti, Carol F.
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1
Antireflecting-chromium linewidth standard, SRM 475, for calibration of optical microscope linewidth measuring systems
by
Vezzetti
,
Carol
F
.
Published: U.S. Dept. of Commerce, National Institute of Standards and Technology ; [Order from National Technical Information Service], 1992
Description: xi, 37 pages : illustrations ; 28 cm.
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2
Antireflecting-chromium linewidth standard, SRM 473, for calibration of optical microscope linewidth measuring systems standard reference materials
by
Vezzetti
,
Carol
F
.
Published: U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology ; [Order from National Technical Information Service], 1992
Description: 1 volume.
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3
Bright-chromium linewidth standard, SRM 476, for calibration of optical microscope linewidth measuring systems
by
Vezzetti
,
Carol
F
.
Published: U.S. Dept. of Commerce, National Institute of Standards and Technology, 1991
Description: xii, 33 pages : illustrations ; 28 cm.
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