Materials science and engineering of carbon characterization /
Materials Science and Engineering of Carbon: Characterization discusses 12 characterization techniques, focusing on their application to carbon materials, including X-ray diffraction, X-ray small-angle scattering, transmission electron microscopy, Raman spectroscopy, scanning electron microscopy, im...
| Other Authors: | Inagaki, Michio,, Kang, Feiyu,, ScienceDirect (Online service) |
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| Format: | eBook |
| Language: | English |
| Published: |
Kidlington, Oxford, UK :
Butterworth-Heinemann is an imprint of Elsevier,
2016.
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| Physical Description: |
1 online resource. |
| Subjects: |
| Summary: |
Materials Science and Engineering of Carbon: Characterization discusses 12 characterization techniques, focusing on their application to carbon materials, including X-ray diffraction, X-ray small-angle scattering, transmission electron microscopy, Raman spectroscopy, scanning electron microscopy, image analysis, X-ray photoelectron spectroscopy, magnetoresistance, electrochemical performance, pore structure analysis, thermal analyses, and quantification of functional groups. Each contributor in the book has worked on carbon materials for many years, and their background and experience will provide guidance on the development and research of carbon materials and their further applications. |
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| Item Description: |
Materials Science and Engineering of Carbon: Characterization discusses 12 characterization techniques, focusing on their application to carbon materials, including X-ray diffraction, X-ray small-angle scattering, transmission electron microscopy, Raman spectroscopy, scanning electron microscopy, image analysis, X-ray photoelectron spectroscopy, magnetoresistance, electrochemical performance, pore structure analysis, thermal analyses, and quantification of functional groups. Each contributor in the book has worked on carbon materials for many years, and their background and experience will provide guidance on the development and research of carbon materials and their further applications. Includes index. Front Cover; Materials Science and Engineering of Carbon: Characterization; Materials Science and Engineering of Carbon: Characterization ; Copyright; Contents; Companion Web Site; List of Contributors; Preface; Acknowledgments; 1 -- Introduction; 1.1 CARBON MATERIALS; 1.2 CHARACTERIZATION OF CARBON MATERIALS; 1.3 STRUCTURE OF THE PRESENT BOOK; REFERENCES; 2 -- X-ray Powder Diffraction; 2.1 INTRODUCTION; 2.2 X-RAY DIFFRACTION PATTERN OF CARBON MATERIALS; 2.3 PARAMETERS DETERMINED BY X-RAY DIFFRACTION; 2.4 INSTRUMENTATION; 2.5 SPECIFICATIONS FOR MEASUREMENT. 2.5.1 PREPARATION OF SAMPLE FOR X-RAY MEASUREMENTS2.5.2 MEASUREMENT AND INTENSITY CORRECTION OF DIFFRACTION PROFILES; 2.5.3 CORRECTION OF DIFFRACTION ANGLE WITH INTERNAL STANDARD; 2.5.4 DETERMINATION OF FULL WIDTH AT HALF MAXIMUM INTENSITY; 2.5.5 ACCURACY OF THE VALUES DETERMINED; 2.6 DEGREE OF GRAPHITIZATION; 2.7 KEY ISSUES FOR MEASUREMENT; 2.7.1 DIFFRACTION PATTERN; 2.7.2 USE OF INTERNAL STANDARD; 2.7.3 USE OF THIN SAMPLE HOLDER; 2.7.4 INDEXING THE DIFFRACTION LINE; 2.7.5 SEPARATION INTO COMPONENT PROFILES; 2.8 CONCLUDING REMARKS; REFERENCES; 3 -- Small-Angle X-ray Scattering. 3.1 INTRODUCTION3.2 FUNDAMENTALS; 3.3 KEY ISSUES FOR THE MEASUREMENTS; 3.4 APPLICATIONS FOR CARBON MATERIALS; 3.4.1 POROUS CARBON FIBERS; 3.4.2 GLASS-LIKE CARBONS; 3.4.3 MESOCELLULAR FOAM CARBONS (SILICA-TEMPLATED CARBONS); 3.4.4 OPEN PORES FORMED BY AIR OXIDATION; 3.5 CONCLUDING REMARKS; REFERENCES; 4 -- Transmission Electron Microscopy; 4.1 INTRODUCTION; 4.2 MODES OF TRANSMISSION ELECTRON MICROSCOPY [3-5]; 4.2.1 DIFFRACTING MODE; 4.2.2 IMAGING MODES; 4.3 KEY ISSUES FOR OBSERVATION; 4.3.1 OBJECT THICKNESS (WEAK PHASE OBJECT) [6] 4.3.2 CONTRAST TRANSFER FUNCTION OF THE TRANSMISSION ELECTRON MICROSCOPE [6]4.3.2.1 Objective Lens Defects; 4.3.2.1.1 Spherical Aberration Cs; 4.3.2.1.1 Spherical Aberration Cs; 4.3.2.1.2 Objective Lens Aperture; 4.3.2.1.2 Objective Lens Aperture; 4.3.2.1.3 Ellipticity Astigmatism; 4.3.2.1.3 Ellipticity Astigmatism; 4.3.2.2 Illumination Defects; 4.3.2.2.1 Information Limit (Termination) [12]; 4.3.2.2.1 Information Limit (Termination) [12]; 4.3.2.2.2 Spatial Coherency; 4.3.2.2.2 Spatial Coherency; 4.3.3 DIFFUSION CONTRASTS; 4.3.4 FRESNEL FRINGES, IE, EDGE FRINGES [4] 4.5 APPLICATIONS FOR CARBON MATERIALS [1,2,5,17-19]4.5.1 TRANSMISSION ELECTRON MICROSCOPY MODES TO STUDY CRYSTALLINITY OF CARBON MATERIALS; 4.5.2 TRANSMISSION ELECTRON MICROSCOPY MODES IN THE STUDY OF CARBONIZATION AND GRAPHITIZATION; 4.6 CONCLUSIONS; REFERENCES; FURTHER READING; 5 -- Scanning Electron Microscopy; 5.1 INTRODUCTION; 5.2 INSTRUMENTATION AND RESOLVING POWER; 5.2.1 INSTRUMENTATION; 5.2.2 MAGNIFICATION AND RESOLVING POWER OF THE SCANNING ELECTRON MICROSCOPE; 5.2.3 EDGE EFFECTS APPEARING IN SE MODE IMAGES; 5.3 SPECIMEN PREPARATION. Includes bibliographical references at the end of each chapters and index. |
| Physical Description: |
1 online resource. |
| Bibliography: |
Includes bibliographical references at the end of each chapters and index. |
| ISBN: |
9780128054680 0128054689 |