Theoretical concepts of x-ray nanoscale analysis theory and applications /
This book provides a concise survey of modern theoretical concepts of X-ray materials analysis. The principle features of the book are: basics of X-ray scattering, interaction between X-rays and matter and new theoretical concepts of X-ray scattering. The various X-ray techniques are considered in d...
| Main Author: | Benediktovich, Andrei, |
|---|---|
| Other Authors: | Feranchuk, I. D., Ulyanenkov, Alexander P.,, SpringerLink (Online Service) |
| Format: | eBook |
| Language: | English |
| Published: |
Heidelberg :
Springer,
[2013?]
|
| Physical Description: |
1 online resource (xiii, 318 pages) : illustrations (some color) |
| Series: |
Springer series in materials science ;
v. 183. |
| Subjects: |
| Summary: |
This book provides a concise survey of modern theoretical concepts of X-ray materials analysis. The principle features of the book are: basics of X-ray scattering, interaction between X-rays and matter and new theoretical concepts of X-ray scattering. The various X-ray techniques are considered in detail: high-resolution X-ray diffraction, X-ray reflectivity, grazing-incidence small-angle X-ray scattering and X-ray residual stress analysis. All the theoretical methods presented use the unified physical approach. This makes the book especially useful for readers learning and performing data analysis with different techniques. The theory is applicable to studies of bulk materials of all kinds, including single crystals and polycrystals as well as to surface studies under grazing incidence. The book appeals to researchers and graduate students alike. |
|---|---|
| Item Description: |
Basic principles of the interaction between X-rays and matter -- X-ray reflectivity -- High-resolution X-ray diffraction -- Grazing-incidence small-angle X-ray scattering -- Theory of X-ray scattering from imperfect crystals -- X-ray diffraction for evaluation of residual stresses in polycrystals -- Methods of mathematical and physical optimization of X-ray data analysis. Includes bibliographical references and index. This book provides a concise survey of modern theoretical concepts of X-ray materials analysis. The principle features of the book are: basics of X-ray scattering, interaction between X-rays and matter and new theoretical concepts of X-ray scattering. The various X-ray techniques are considered in detail: high-resolution X-ray diffraction, X-ray reflectivity, grazing-incidence small-angle X-ray scattering and X-ray residual stress analysis. All the theoretical methods presented use the unified physical approach. This makes the book especially useful for readers learning and performing data analysis with different techniques. The theory is applicable to studies of bulk materials of all kinds, including single crystals and polycrystals as well as to surface studies under grazing incidence. The book appeals to researchers and graduate students alike. |
| Physical Description: |
1 online resource (xiii, 318 pages) : illustrations (some color) |
| Bibliography: |
Includes bibliographical references and index. |
| ISBN: |
9783642381775 3642381774 |
| ISSN: |
0933-033X ; |