Effect of dents and gouges on the integrity of pipelines

Main Author: Fields, R. J.
Other Authors: Foecke, T. J., DeWit, R., National Institute of Standards and Technology (U.S.), United States. Department of Energy.
Format: Microfilm
Language: English
Published: Gaithersburg, Md. : Washington, D.C. : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology ; U.S. Dept. of Energy, [1994]
Physical Description: 29 pages : illustrations.
Series: NISTIR ; 5479.
Subjects:
Item Description: Shipping list no.: 99-0512-M.
"June 1994."
Includes bibliographical references (page 7).
Microfiche. [Washington, D.C.] : Supt. of Docs., U.S. G.P.O., [1999] 1 microfiche : negative. s1999 dcun b.
Physical Description: 29 pages : illustrations.
Bibliography: Includes bibliographical references (page 7).