Effect of dents and gouges on the integrity of pipelines

Main Author: Fields, R. J.
Other Authors: Foecke, T. J., DeWit, R., National Institute of Standards and Technology (U.S.), United States. Department of Energy.
Format: Microfilm
Language: English
Published: Gaithersburg, Md. : Washington, D.C. : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology ; U.S. Dept. of Energy, [1994]
Physical Description: 29 pages : illustrations.
Series: NISTIR ; 5479.
Subjects:

CMU Storage Gov Pub Microfiche

LocationCall Number: Status
CMU Storage Gov Pub Microfiche C 13.58:5479 Available