Holdings: User's manual for the program MONSEL-1

Main Author:	Lowney, J. R. 1946-
Other Authors:	Marx, Egon., National Institute of Standards and Technology (U.S.)
Format:	Microfilm
Language:	English
Published:	Gaithersburg, MD : Washington, DC : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology ; For sale by the Supt. of Docs., U.S. G.P.O., 1994.
Physical Description:	iv, 39 pages : illustrations ; 28 cm.
Series:	Semiconductor measurement technology. NIST special publication ; 400-95.
Subjects:	Scanning electron microscopy -- Computer programs -- Handbooks, manuals, etc. Monte Carlo method -- Computer programs -- Handbooks, manuals, etc. Electrons -- Scattering -- Computer simulation -- Handbooks, manuals, etc.

Location	Call Number:	Status
CMU Storage Gov Pub Microfiche	C 13.10:400-95	Available