Accuracy in powder diffraction II proceedings of the international conference, May 26-29, 1992 / E. Prince and J.K. Stalick, editors ; organized by Commission on Powder Diffraction of the International Union of Crystallography ; sponsored by JCPDS--International Centre for Diffraction Data, International Union of Crystallography, National Institute of Standards and Technology.

Other Authors: Prince, Edward., Stalick, J. K., International Union of Crystallography. Commission on Powder Diffraction., JCPDS--International Centre for Diffraction Data., International Union of Crystallography., National Institute of Standards and Technology (U.S.)
Format: Microfilm
Language: English
Published: Gaithersburg, MD : Washington : [Springfield, VA] : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology ; For sale by the Supt. of Docs., U.S. G.P.O. ; [Order from National Technical Information Service], 1992.
Physical Description: vi, 234 pages : illustrations ; 28 cm.
Series: NIST special publication ; 846.
Subjects:
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245 0 0 |a Accuracy in powder diffraction II  |h [microform] :  |b proceedings of the international conference, May 26-29, 1992 / E. Prince and J.K. Stalick, editors ; organized by Commission on Powder Diffraction of the International Union of Crystallography ; sponsored by JCPDS--International Centre for Diffraction Data, International Union of Crystallography, National Institute of Standards and Technology. 
246 3 |a Accuracy in powder diffraction 2. 
264 1 |a Gaithersburg, MD :  |b U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology ;  |a Washington :  |b For sale by the Supt. of Docs., U.S. G.P.O. ;  |a [Springfield, VA] :  |b [Order from National Technical Information Service],  |c 1992. 
300 |a vi, 234 pages :  |b illustrations ;  |c 28 cm. 
336 |a text  |b txt  |2 rdacontent. 
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338 |a microfiche  |b he  |2 rdacarrier. 
490 1 |a NIST special publication ;  |v 846. 
500 |a Distributed to depository libraries in microfiche. 
500 |a Shipping list no.: 93-0538-M. 
500 |a "Issued October 1992." 
504 |a Includes bibliographical references and index. 
513 |a Final. 
533 |a Microfiche.  |b [Washington, D.C.?] :  |c Supt. of Docs., U.S. G.P.O.,  |d [1993]  |e 3 microfiches : negative. 
650 0 |a X-rays  |x Diffraction  |x Measurement  |v Congresses. 
650 0 |a Powders  |x Optical properties  |x Measurement  |v Congresses. 
655 7 |a Congresses.  |2 lcgft. 
655 7 |a Technical reports.  |2 lcgft. 
655 7 |a Conference papers and proceedings.  |2 lcgft. 
700 1 |a Prince, Edward. 
700 1 |a Stalick, J. K. 
710 2 |a International Union of Crystallography.  |b Commission on Powder Diffraction. 
710 2 |a JCPDS--International Centre for Diffraction Data. 
710 2 |a International Union of Crystallography. 
710 2 |a National Institute of Standards and Technology (U.S.) 
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