Accuracy in powder diffraction II proceedings of the international conference, May 26-29, 1992 / E. Prince and J.K. Stalick, editors ; organized by Commission on Powder Diffraction of the International Union of Crystallography ; sponsored by JCPDS--International Centre for Diffraction Data, International Union of Crystallography, National Institute of Standards and Technology.

Other Authors: Prince, Edward., Stalick, J. K., International Union of Crystallography. Commission on Powder Diffraction., JCPDS--International Centre for Diffraction Data., International Union of Crystallography., National Institute of Standards and Technology (U.S.)
Format: Microfilm
Language: English
Published: Gaithersburg, MD : Washington : [Springfield, VA] : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology ; For sale by the Supt. of Docs., U.S. G.P.O. ; [Order from National Technical Information Service], 1992.
Physical Description: vi, 234 pages : illustrations ; 28 cm.
Series: NIST special publication ; 846.
Subjects:

CMU Storage Gov Pub Microfiche

LocationCall Number: Status
CMU Storage Gov Pub Microfiche C 13.10:846 Available