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Subject: Integrated circuits Testing
Institution
Collection
Format
Subject
Integrated circuits Testing
3
Integrated circuits Verification
2
Algebra, Boolean
2
Computer software Verification
2
Integrated circuits Design and construction
2
Integrated circuits Reliability
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2
Semiconductors Testing
1
Computer programs Verification
1
Computer software Testing
1
Computers Power supply
1
Debugging in computer science
1
Electronic analog computers Circuits Defects
1
Electronic analog computers Circuits Testing
1
Integrated circuits Defects
1
Integrated circuits Fault tolerance
1
Integrated circuits Very large scale integration
1
Linear integrated circuits
1
Linear integrated circuits Testing
1
Nanotechnology
1
Nondestructive testing
1
Power transistors Thermal properties
1
Product counterfeiting
1
Semiconductors Defects
1
Temperature measurements
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Author
9
SpringerLink (Online service)
3
Drechsler, Rolf
3
ScienceDirect (Online service)
3
Tehranipoor, Mohammad H., 1974-
1
Afshar, Amir
1
Ahmad, Nisar
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1
Barua, Alok
1
Blackburn, David L.
1
Chakrabarty, Krishnendu
1
Eggersglüss, Stephan
1
Forte, Domenic,
1
Guin, Ujjwal,
1
Heyman, Joseph S.
1
Huhn, Sebastian, 1974-
1
International Haifa Verification Conference
1
International Haifa Verification Conference Haifa, Isarel)
1
Jowett, C. E.
1
Kabisatpathy, Prithviraj
1
Monteiro, José, 1966-
1
Namjoshi, Kedar S.
1
National Institute of Standards and Technology (U.S.)
1
Oettinger, Frank F.
1
PATMOS (Workshop)
1
PATMOS (Workshop) Lisbon, Portugal)
1
Pang, Ke
1
Sinha, Satyabroto
1
Svensson, Lars, 1960-
1
Zeller, Andreas
1
Ziv, Avi
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