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Principles of semiconductor network testing
This book gathers together comprehensive information which test and process professionals will find invaluable. The techniques outlined will help ensure that test methods and data collected reflect actual device performance, rather than 'testing the tester' or being lost in the noise floor...
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| Format: | eBook |
| Language: | English |
| Published: |
Boston :
Butterworth-Heinemann,
[1995]
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| Physical Description: |
1 online resource (xiv, 213 pages) : illustrations. |
| Subjects: | |
| Online Access: | Elsevier - Click here for access |
| Copy 1 | CMU Electronic Access | Online |
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