Refracted-ray scanning (refracted near-field scanning) for measuring index profils of optical fibers

Main Author: Young, Matt, 1941-
Other Authors: United States. National Bureau of Standards,, National Engineering Laboratory (U.S.). Electromagnetic Technology Division,
Format: Microfilm
Language: English
Published: [Washington, D.C.?] : U.S. Dept. of Commerce, National Bureau of Standards : For sale by the Supt. of Docs., U.S. G.P.O., 1981.
Physical Description: 49 pages : illustrations ; 27 cm.
Series: NBS technical note ; 1038.
Subjects:

CMU Storage Gov Pub Microfiche

LocationCall Number: Status
CMU Storage Gov Pub Microfiche C 13.46:1038 Available