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Optical characterization of real surfaces and films
This new volume of the highly respected Physics of Thin Films Serial discusses inhomogeneity in real films and surfaces. The volume, guest-edited by K. Vedam, follows the growth of thin films both from the surface of the substrate, and from the atomic level, layer by layer. The text features coverag...
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| Format: | eBook |
| Language: | English |
| Published: |
Boston :
Academic Press,
1994.
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| Series: | Physics of thin films ;
v. 19. |
| Physical Description: |
1 online resource (xv, 328 pages) : illustrations. |
| Subjects: | |
| Online Access: | Elsevier - Click here for access |
| Copy 1 | CMU Electronic Access | Online |
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