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Optical characterization of real surfaces and films
This new volume of the highly respected Physics of Thin Films Serial discusses inhomogeneity in real films and surfaces. The volume, guest-edited by K. Vedam, follows the growth of thin films both from the surface of the substrate, and from the atomic level, layer by layer. The text features coverag...
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Corporate Author: | |
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Other Authors: | |
Format: | eBook |
Language: | English |
Published: |
Boston :
Academic Press,
1994.
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Series: | Physics of thin films ;
v. 19. |
Physical Description: |
1 online resource (xv, 328 pages) : illustrations. |
Subjects: | |
Online Access: | Elsevier - Click here for access |
Copy 1 | CMU Electronic Access | Online |
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