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Principles of semiconductor network testing

This book gathers together comprehensive information which test and process professionals will find invaluable. The techniques outlined will help ensure that test methods and data collected reflect actual device performance, rather than 'testing the tester' or being lost in the noise floor...

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Bibliographic Details
Main Author:	Afshar, Amir
Corporate Author:	ScienceDirect (Online service)
Format:	eBook
Language:	English
Published:	Boston : Butterworth-Heinemann, [1995]
Physical Description:	1 online resource (xiv, 213 pages) : illustrations.
Subjects:	Integrated circuits -- Testing. Semiconductors -- Testing. Electronic book.
Online Access:	Elsevier - Click here for access

Fault diagnosis of analog integrated circuits by Kabisatpathy, Prithviraj

Published: Springer, 2005

Description: 1 online resource (ix, 182 pages) : illustrations.

SpringerLink - Click here for access

eBook

Principles of semiconductor network testing

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