Transmission Electron Microscopy and Diffractometry of Materials
This book explains concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The fourth edition adds important new techniques of TEM such as electron tomography, nanobeam diffraction, and geometric phase analysis. A ne...
| Main Author: | Fultz, B. |
|---|---|
| Other Authors: | Howe, James M., 1955-, SpringerLink (Online service) |
| Format: | eBook |
| Language: | English |
| Published: |
Berlin, Heidelberg :
Springer Berlin Heidelberg, Imprint Springer.
2013 :
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| Physical Description: |
1 online resource (XX, 764 pages) : online resource. |
| Edition: | 4th ed. 2013. |
| Series: |
Graduate texts in physics.
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| Subjects: |
CMU Electronic Access
Electronic Resource Click Here| Location | Call Number: | Status |
|---|---|---|
| CMU Electronic Access | Available |