Scanning system for measuring uniformity of laser detector response and laser beam dimensions

Main Author: Rasmussen, A. L.
Other Authors: Case, William E., Sanders, A. A., National Institute of Standards and Technology (U.S.)
Format: Microfilm
Language: English
Published: Boulder, Colo. : [Springfield, VA] : U.S. Dept. of Commerce, National Institute of Standards and Technology ; [Order from National Technical Information Service], [1990]
Physical Description: 1 volume.
Series: NISTIR ; 3937.
Subjects:

CMU Storage Gov Pub Microfiche

LocationCall Number: Status
CMU Storage Gov Pub Microfiche C 13.58:90-3937 Available