Static tests of one-third scale impact limiters

Main Author: Phan, Long T. 1958-
Other Authors: Lew, H. S., National Institute of Standards and Technology (U.S.)
Format: Microfilm
Language: English
Published: [Gaithersburg, MD] : [Springfield, VA] : U.S. Dept. of Commerce, National Institute of Standards and Technology ; [Order from National Technical Information Service], [1989]
Physical Description: vii, 47 pages : illustrations ; 28 cm.
Series: NISTIR ; 4089.
Subjects:

CMU Storage Gov Pub Microfiche

LocationCall Number: Status
CMU Storage Gov Pub Microfiche C 13.58:89-4089 Available