Loading…

VLSI-SoC System-on-Chip in the Nanoscale Era - Design, Verification and Reliability : 24th IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2016, Tallinn, Estonia, September 26-28, 2016, Revised Selected Papers /

This book contains extended and revised versions of the best papers presented at the 24th IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2016, held in Tallinn, Estonia, in September 2016. The 11 papers included in the book were carefully reviewed and selected fr...

Full description

Saved in:
Bibliographic Details
Corporate Authors: International Conference on Very Large Scale Integration Tallinn, Estonia, SpringerLink (Online service)
Other Authors: Hollstein, Thomas (Editor), Raik, Jaan, 1972- (Editor), Kostin, Sergeĭ (Editor), Tšertov, Anton (Editor), O'Connor, Ian (Editor), Reis, Ricardo A. L. (Ricardo Augusto da Luz) (Editor)
Format: Conference Proceeding eBook
Language:English
Published: Cham : Springer International Publishing, 2017.
Series:IFIP advances in information and communication technology ; 508.
Physical Description:
1 online resource (XIV, 233 pages) : 129 illustrations.
Subjects:
Online Access:SpringerLink - Click here for access
Holdings details from CMU Electronic Access C502
Copy 1 CMU Electronic Access Available

Internet

SpringerLink - Click here for access