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|a Celano, Umberto,
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|a Metrology and physical mechanisms in new generation ionic devices /
|c Umberto Celano.
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|a Switzerland :
|b Springer,
|c 2016.
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|a 1 online resource (xxiv, 175 pages) :
|b illustrations (some color).
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|a "Doctoral thesis accepted by the KU Leuven and IMEC, Belgium."
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|a Includes bibliographical references.
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|a Online resource; title from PDF title page (SpringerLink, viewed June 28, 2016).
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|a Introduction -- Filamentary-Based Resistive Switching -- Nanoscaled Electrical Characterization -- Conductive Filaments: Formation, Observation and Manipulation -- Three-Dimensional Filament Observation -- Reliability Threats in CBRAM -- Conclusions and Outlook.
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|a The thesis presents the first direct observations of the 3D-shape, size and electrical properties of nanoscale filaments, made possible by a new Scanning Probe Microscopy-based tomography technique referred to as scalpel SPM. Using this innovative technology and nm-scale observations, the author achieves essential insights into the filament formation mechanisms, improves the understanding required for device optimization, and experimentally observes phenomena that had previously been only theoretically proposed.
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|a Thin films.
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|a Nonvolatile random-access memory.
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|a Couches minces.
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|a Métrologie.
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|a Ordinateurs
|x Mémoires vives non volatiles.
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|a Precision instruments manufacture.
|2 bicssc.
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|a SpringerLink (Online service)
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|i Print version:
|a Celano, Umberto.
|t Metrology and physical mechanisms in new generation ionic devices : Doctoral Thesis accepted by the KU Leuven and IMEC, Belgium.
|d [Cham], Switzerland : Springer, ©2016
|h xxiv, 175 pages
|k Springer theses.
|x 2190-5061
|z 9783319395302.
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