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Practical materials characterization
This unique book covers the most common materials analysis techniques, such as transmission electron microscopy, x-ray diffraction and reflectivity, auger electron spectroscopy, secondary ion mass spectrometry, photoelectron spectroscopy, and several optical characterization methods. It stands as a...
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Corporate Author: | |
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Other Authors: | |
Format: | eBook |
Language: | English |
Published: |
New York, NY :
Springer,
2014.
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Physical Description: |
1 online resource (vii, 237 pages) : illustrations (some color) |
Subjects: | |
Online Access: | SpringerLink - Click here for access |
Copy 1 | CMU Electronic Access | Available |
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