Fault analysis in cryptography
In the 1970s researchers noticed that radioactive particles produced by elements naturally present in packaging material could cause bits to flip in sensitive areas of electronic chips. Research into the effect of cosmic rays on semiconductors, an area of particular interest in the aerospace industr...
| Other Authors: | Joye, Marc, 1969-, Tunstall, Michael., SpringerLink (Online service) |
|---|---|
| Format: | eBook |
| Language: | English |
| Published: |
Berlin ; New York :
Springer,
©2012.
Berlin ; New York : [2012] |
| Physical Description: |
1 online resource : illustrations. |
| Series: |
Information security and cryptography.
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| Subjects: |
CMU Electronic Access
Electronic Resource Click Here| Location | Call Number: | Status |
|---|---|---|
| CMU Electronic Access | Available |